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Intrinsic Quality Test Industry News

Circuits Assembly has published its annual list of the Top 50 EMS companies.

2015 was less significant for what did happen than for what did not.
Foxconn didn’t collapse under its own weight. The PC slowdown didn’t take out any major players, despite shipments falling five straight quarters for the first time in history. Acquisitions were strategic, not outlandish. (To wit: Airbus floated its billion-dollar defense electronics business and no one bit.) Assemblers expanded from China but didn’t leave China.

On a macro level, global electronics production was an estimated $1.86 trillion in 2015, with China leading the way. China accounted for 38% of electronics equipment production, while low-cost geographies overall accounted for 69% of the total.

Compared to 30 years ago, the changes are startling. Production value overall has risen 78% from $1.05 trillion. China’s share of world production in 1995 was a meager 2.6%. Meanwhile, the share controlled by mature geographies has fallen to 31% from 75% in 1995.

Read the complete article…

CircuitAssemblies Top 50 EMS 2015

An Efficient PXI Test System Hardware Architecture

Test system architecture can be the critical difference between money well spent or money wasted. Quality instruments, components and software are essential ingredients, but without a sensible architecture, achieving an efficient system is not likely.

Like most any subject, a lot can be learned by history. Test systems have been designed for years and several commercial systems have long term success. Recently, a powerful hardware architecture has emerged that points the way for the design of a new tester.
Efficient PXI Test System: Read More…

ABex PXI Rack

Making design-for-test a push-button process

Implementing a Design for Test approach when designing PCBs at the schematic capture stage can now be significantly assisted using an innovative and free software extension that adds design verification to Altium Designer.

The concept of ‘right by design’ could imply that the design in question will always work as expected, so there is no need to test it once it has been designed ‘right’. While this is true, in principle, it is also true that testing isn’t primarily a process of finding design faults; that’s a development issue.
Design For Test: Read More…

XJtagDFT

Lessons from an Industry Leader

Last month I was privileged to travel with our partner, SMH Technologies to visit major customers in the Midwest. The SMH group was led by their president, Claudio Stefani. We met with several customers and prospects, addressing questions and presenting the new SMH FlashRunner 2.0. Between meetings there was a lot of travel time where we had a chance to exchange ideas. Industry Leader Lessons: Read More…
SMH FlashRunner 2.0

SMH Support Center

Intrinsic Quality is pleased to announce a new client relationship with SMH Technologies, offering sales, tech support and expert integration of SMH’s complete product line.

In addition, IQ is providing algorithms for the SMH FlashRunner Series 1, and drivers for SMH’s new FlashRunner 2.0 In-System parallel programmer. SMH Support: Read More…

SMH FlashRunner Universal Device Programmer

Take Scan Test out of the Critical Path

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast as possible.

DFT (design for test) tools are used to make the designs more easily tested and to produce production test patterns. Read the complete article…

ScanTestModel

Flash Device Programming: When free isn’t free

Sometimes an effective plan for production Flash programming gets created. For the high volume manufacturer, a variety of solutions are available. But few options exist for lower volume production. High volume solutions are simply too expensive for mid volume or low volume/high mix production. For low volumes, the implementation of production Flashing often gets minimal planning. The assumption is its easy and virtually free.

On low volume/high mix production lines, this problem is often addressed with several low cost ad hoc stations that use ‘free” programming pods provided by device manufacturers. Engineers typically will cobble together a set of existing equipment, computers and peripherals to create a programming tool for a solitary task in the test process. Read more…

klugeartistic2

Konrad Technologies Support Center

Intrinsic Quality is pleased to announce a new client relationship with Konrad Technologies, offering sales, tech support and expert integration of Konrad’s complete line of standard solutions for your production cycle.
learn more…

In addition, IQ offers full integration of Konrad testers for specialized custom solutions. IQ’s Test Equipment

Konrad Technologies Test Systems

PXI Instrumentation for In-Circuit Test

Konrad Technologies expands the capabilities of the National Instruments PXI platform through their innovative ABex and KT-501 In-Circuit Test systems.

ICT KT-501

There is something new in ICT. Really! Konrad Technologies has introduced a new flexible architecture that enables multiple parallel test heads. But even more, the architecture allows for flexible configuration – the number of test heads can change without changing hardware.
Konrad’s KT 501 module implements a complete analog ICT instrument on a single PXI card. Once connected to a switching matrix it becomes a versatile Manufacturing Defects Analyzer (MDA). More on Konrad KT-501 PXI

 

KT-PXI-501

What’s Missing from Design for Testability?

For years, engineers have neglected the “design” part of design-for-test. DFT shouldn’t be an afterthought and test engineers can take on some of the task.

Design for Testability (DFT) is comprised of two very important terms. “Testability” is a condition of a circuit that makes it possible, easy, and cost-effective to test and diagnose the circuit (unit) under test (UUT). There is a wide acceptance that such a characteristic should be part of electronics ICs, boards and systems, too. After all, without DFT, faults can go undetected, making them difficult to repair. For far too long, the “Design” part of DFT that has been neglected.

read the complete article by Louis Y. Unger on EE Times…

Design For Test DFT

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